If you require the NSN part 385945 1, manufactured by Edo Corporation having CAGE Code 00752 and categorized under FSC 5962 Microcircuits Electronic under NSN 5962001972361, then look no further than NSN Gamut. Our company, which is owned and managed by ASAP Semiconductor, a distributor in the aerospace and defense industry, has an inventory of over two billion new and obsolete NSN parts, including part 385945 1 Microcircuit Linear and many more.
At NSN Gamut, we have a strict policy of not sourcing from China, ensuring that all parts you buy from us are completely traceable or sourced directly from reputable manufacturers like Edo Corporation. Obtain a quote now for 385945 1. In any case if you don't find your required part submit our straight RFQ and get your part in on time.
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We offer a vast range of NSN 5962001972361 parts, including 385945 1, with quick lead times and competitive prices. NSN Gamut has a large selection of in-demand parts from manufacturers such as Edo Corporation and others. To speak with a dedicated account manager, just submit an RFQ for 385945 1 with your basic details like your company name parts quantity required, and get your quote in 15 minutes or less.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-00-197-2361 Item Description: Microcircuit Linear | 5962 | 001972361 | 0 | N | A | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | A | A | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
385945 1 | 3 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
ADAR | BODY OUTSIDE DIAMETER | 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 500.0 MILLIWATTS |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND HIGH GAIN AND INTERNALLY COMPENSATED AND NEGATIVE OUTPUTS |
CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
CQSZ | INCLOSURE CONFIGURATION | CAN |
CQZP | INPUT CIRCUIT PATTERN | DUAL 2 INPUT |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CWSG | TERMINAL SURFACE TREATMENT | TIN |
CZEQ | TIME RATING PER CHACTERISTIC | 300.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
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