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Quality guaranteed We sell only warrantied and traceable partsIf you require the NSN part F10NB-L01-0001, manufactured by Fei Microwave Inc having CAGE Code 21847 and categorized under FSC 5961 Semiconductor Devices and Associated Hardware under NSN 5961001752844, then look no further than NSN Gamut. Our company, which is owned and managed by ASAP Semiconductor, a distributor in the aerospace and defense industry, has an inventory of over two billion new and obsolete NSN parts, including part F10NB-L01-0001 Semiconductor Devic and many more.
At NSN Gamut, we have a strict policy of not sourcing from China, ensuring that all parts you buy from us are completely traceable or sourced directly from reputable manufacturers like Fei Microwave Inc. Obtain a quote now for F10NB-L01-0001. In any case if you don't find your required part submit our straight RFQ and get your part in on time.
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We offer a vast range of NSN 5961001752844 parts, including F10NB-L01-0001, with quick lead times and competitive prices. NSN Gamut has a large selection of in-demand parts from manufacturers such as Fei Microwave Inc and others. To speak with a dedicated account manager, just submit an RFQ for F10NB-L01-0001 with your basic details like your company name parts quantity required, and get your quote in 15 minutes or less.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-00-175-2844 Item Description: Semiconductor Devic | 5961 | 001752844 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | U | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| F10nb-L01-0001 | 2 | 9 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
| ABHP | OVERALL LENGTH | 0.190 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.210 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ADAV | OVERALL DIAMETER | 0.078 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.084 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AFZC | FUNCTION FOR WHICH DESIGNED | DETECTOR AND MIXER |
| ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE |
| FEAT | SPECIAL FEATURES | 9.3 GHZ TEST FREQUENCY; 6.5 DECIBEL NOISE FIGURE |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 BINDING POST ALL SEMICONDUCTOR DEVICE DIODE |
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